Signatone RF - mmWave
Wavelink manual & semiautomatic
Designed for accurate high-frequency measurements of die, shards and whole wafers to 300mm diameter. Manual & semiautomatic solutions are offered in three basic platforms to meet your needs while remaining within your budget.
Signatone DC manual & semiautomatic probe stations
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CheckMate DC Probe Test Systems
The Signatone CheckMate is a stable analytical probe station for probing of wafers up to 300mm diameter. Three manual and semiautomatic platforms are offered for device engineering & failure analysis. Triaxially guarded wafer chucks and probe arms allow for measurement with fA resolution. Signatone's Blue Cable Kit is compatible with leading PNA's such as Keithley's 4200 PMU and AMCAD Pulsed I/V measurement unit.
Signatone High I/V
High Current/High Voltage
Signatone PowerPro supports on-state, off-state, and current collapse characterization of on-wafer power devices up to 3kV triax / 10kV coax, and 400A pulsed / 10A DC.
General Purpose/Engineering
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General Purpose/Educational
Signatone has been recognized as a leading Supplier of affordable microprobe test solutions and is a favorite within the UC School System. The 1100 Series handles die and wafers to 200mm. The even more affordable H150 prober has many of the same features for 100mm wafers.
Resistivity Test
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Resistivity/Four-Point-Probe Test
Signatone has offered an in-line four point probing solutions since 1968. The Signatone Pro4 provides simple answers to sheet and bulk resistivity measurements. Stands support up to 300mm wafers. Hand-held solutions available too.
Automated TCR resistivity test
Automated TCR probe test
The QuadProII is designed to for temperature-coefficient of resistance research of wafers, thin films, solar cells and other materials. Samples up to 300mm in diameter can be tested at temperatures up to 600C.