The phoenix microme|x neo and nanome|x neo provide high-resolution 2D X-ray technology and 3D computed tomography( CT) scanning in one system, enabling non-destructive testing (NDT) of electronic components
The phoenix nanotom® m is designed for scientific computed tomography and metrology. Fully automated execution of CT scan, reconstruction and analysis process ensures its ease of use and fast, reliable CT results.
This 2D+ CT scanner is ideally suited to meet inspection challenges in the electronics, R&D, scientific, and automotive industries. 3D scan size up to 260 mm Ø x 420 mm, max.
400 mm Ø with optional offset|CT
Our powerful industrial computer tomography (CT) system, designed for 3D metrology and analysis, provides industry-leading magnification at 300 kV. 360 mm x 600 mm; up to 500 x 600 mm with limited travel range, max. 3D scan size up to 420 mm Ø x 400 mm